All CMM Software performs identical tasks and use identical algorithms to calculate results.
Metrology capabilities may vary from one CMM software to another however most CMM Software suppliers create the impression that the more complex and cumbersome the user interface the more user perception of product capabilities.

Enter OpenDMIS ®, a full function next generation CMM software product with all the necessary Professional CMM User capabilities without the incumbency of an ineffective user interface with long training periods and learning curves.

OpenDMIS ® presents a truly unique and innovative user interface by combining impressive capabilities within a dynamic user interface that is easy to navigate and intuitive in concept characterized by:

• No 'pop-up' windows
• Dynamic function sensitive Tool Bars
  
• Action Icons and Context Sensitive Work Areas
  
• The Graphics Viewer remains 100% visible at all times maximizing operating efficiency unlike competitive products that become crowded with redundant open windows impairing software utilization and requiring multiple mouseclicks.
• Drag and Drop functionality
  
• Click to Measure simplicity
  
• Seamless CAD integration
  
• DMIS 5.0 Compliance

CAD Capability

•  3D CAD Import - IGES, STEP. DXF   
•  Solid Model part and fixture representation
  
•   Bi-directional transfer of data
  
•   IGES export of measured data
  
•   DMIS 5.0 import and export
  
•   CAD model mirroring
  
•   Multiple CAD model import
  
•   CAD Geometry recognition
  
•   CAD Model layering and coloring
  
•   Solid or wire model representation
  
•   World coordinate translation

Intelligent Measurement

•   Object based programming
  
•  Auto probe to feature alignment
  
•   DMIS Navigator TM
  
•   Smart Measure Algorithms
  
•   Collision avoidance
  
•   Click 2 Measure TM
  
•   Move-to simulation

Automatic Routines

•  Probe calibrations   
• Picked nominal feature inspection
  
• Scanning  
• Feature relative measurement  
• Grid points  
• Click 2 Measure TM  
• Object selection from CAD

Scanning

•   Analog Probe Scanning  
•   Data export in IGES B-spline
  
•   CAD nominal definition
  
•   ASCII data input
  
•   Nominal curve scanning
  
•   Profile analysis with tolerancing
  
•   Whisker plots

Virtual Programming

•   Inspection program creation from CAD model
  
•  Simulation, verification and optimization
  
•   Part and Tooling visualization
  
•   On-line and off-line application
  
•   Auto switching between modes on-line
  
•   CMM and Probe simulation
  
•   Dynamic CMM modeling
  
•   Renishaw graphics probe library
  
•   Motion path simulation
  
•   Crash prediction and avoidance
  
•   DMIS 5.0

Relative Measurement 

• Thin wall components
  
•   Material thickness compensation
  
•   Vector build macros
  
•  Mirroring
  
•   Feature pattern analysis
  
•   Hemmed edges, edge points, rail checks
  
•   Feature pattern analysis
  
•   Automatic Routine

OpenDMIS Reporting

•   Traditional Numerical ASCII reports   
•   Ballooned Graphical reports  
•    HTML Reports
•    Annotation of displayed graphics
  
•   CAD model annotation
  
•   Database drag & drop
  
•   Excel file output
  
•   Whisker plots
  
•   Integrated SPC